DocumentCode
376720
Title
Analysis of equilateral triangle semiconductor microlasers with rough sidewalls
Author
Yong-Zhen Huang ; Wei-Hua Guo ; Li-Juan Yu ; Hong-Bing Lei
Author_Institution
Inst. of Semicond., Acad. Sinica, Beijing, China
Volume
2
fYear
2001
fDate
15-19 July 2001
Abstract
The mode frequencies and quality factors are calculated for the equilateral triangle semiconductor microlasers with sinusoidal and random Gaussian sidewalls. The results show that the modes can still have high Q-factors.
Keywords
Q-factor; finite difference time-domain analysis; laser modes; microcavity lasers; rough surfaces; semiconductor lasers; Pade approximation; equilateral triangle resonator; equilateral triangle semiconductor microlasers; finite-difference time-domain technique; mode frequencies; mode quality factors; random Gaussian sidewalls; rough sidewalls; sinusoidal sidewalls; Dry etching; Finite difference methods; Fluctuations; Frequency; Integrated optoelectronics; Laboratories; Optical reflection; Q factor; Solids; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2001. CLEO/Pacific Rim 2001. The 4th Pacific Rim Conference on
Conference_Location
Chiba, Japan
Print_ISBN
0-7803-6738-3
Type
conf
DOI
10.1109/CLEOPR.2001.971108
Filename
971108
Link To Document