• DocumentCode
    3768033
  • Title

    Extended finite element method for electromagnetic fields

  • Author

    Na Na Duan;Wei Jie Xu;Shu Hong Wang;Hai Lin Li;You Guang Guo;Jian Guo Zhu

  • Author_Institution
    State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi´an Jiaotong University, Xi´an 710049, China
  • fYear
    2015
  • Firstpage
    364
  • Lastpage
    365
  • Abstract
    This paper presents the fundamental principle of the extended finite element method (XFEM) for electromagnetic field analysis. This method provides an accurate approximation for locally non-smooth features within finite elements, such as singularities, discontinuities, and high derivatives. An alternative enrichment function is introduced to improve the approximation space of the conventional finite element method (CFEM) such that non-smooth solutions are modeled independent of the mesh. The level set method is employed to describe the interfaces among different materials. To demonstrate the advantages, the XFEM is compared with CFEM by solving a 1D electrical field problem.
  • Keywords
    "Finite element analysis","Dielectrics","Level set","Nickel","Electric potential","Electromagnetic fields","Electrodes"
  • Publisher
    ieee
  • Conference_Titel
    Applied Superconductivity and Electromagnetic Devices (ASEMD), 2015 IEEE International Conference on
  • Print_ISBN
    978-1-4673-8106-2
  • Type

    conf

  • DOI
    10.1109/ASEMD.2015.7453614
  • Filename
    7453614