DocumentCode
3768033
Title
Extended finite element method for electromagnetic fields
Author
Na Na Duan;Wei Jie Xu;Shu Hong Wang;Hai Lin Li;You Guang Guo;Jian Guo Zhu
Author_Institution
State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi´an Jiaotong University, Xi´an 710049, China
fYear
2015
Firstpage
364
Lastpage
365
Abstract
This paper presents the fundamental principle of the extended finite element method (XFEM) for electromagnetic field analysis. This method provides an accurate approximation for locally non-smooth features within finite elements, such as singularities, discontinuities, and high derivatives. An alternative enrichment function is introduced to improve the approximation space of the conventional finite element method (CFEM) such that non-smooth solutions are modeled independent of the mesh. The level set method is employed to describe the interfaces among different materials. To demonstrate the advantages, the XFEM is compared with CFEM by solving a 1D electrical field problem.
Keywords
"Finite element analysis","Dielectrics","Level set","Nickel","Electric potential","Electromagnetic fields","Electrodes"
Publisher
ieee
Conference_Titel
Applied Superconductivity and Electromagnetic Devices (ASEMD), 2015 IEEE International Conference on
Print_ISBN
978-1-4673-8106-2
Type
conf
DOI
10.1109/ASEMD.2015.7453614
Filename
7453614
Link To Document