DocumentCode :
3768033
Title :
Extended finite element method for electromagnetic fields
Author :
Na Na Duan;Wei Jie Xu;Shu Hong Wang;Hai Lin Li;You Guang Guo;Jian Guo Zhu
Author_Institution :
State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi´an Jiaotong University, Xi´an 710049, China
fYear :
2015
Firstpage :
364
Lastpage :
365
Abstract :
This paper presents the fundamental principle of the extended finite element method (XFEM) for electromagnetic field analysis. This method provides an accurate approximation for locally non-smooth features within finite elements, such as singularities, discontinuities, and high derivatives. An alternative enrichment function is introduced to improve the approximation space of the conventional finite element method (CFEM) such that non-smooth solutions are modeled independent of the mesh. The level set method is employed to describe the interfaces among different materials. To demonstrate the advantages, the XFEM is compared with CFEM by solving a 1D electrical field problem.
Keywords :
"Finite element analysis","Dielectrics","Level set","Nickel","Electric potential","Electromagnetic fields","Electrodes"
Publisher :
ieee
Conference_Titel :
Applied Superconductivity and Electromagnetic Devices (ASEMD), 2015 IEEE International Conference on
Print_ISBN :
978-1-4673-8106-2
Type :
conf
DOI :
10.1109/ASEMD.2015.7453614
Filename :
7453614
Link To Document :
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