Title :
Millimeter wave imaging technologies
Author_Institution :
Res. Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan
Abstract :
Imaging technologies using millimeter (MM) waves offer unique measurement means in many application areas. We discuss here MM-wave focal plane imaging technologies whose resolution is limited by diffraction and also MM-wave scanning near-field microscopy whose resolution is much smaller than operating wavelength. Results of our research on both of these imaging technologies are presented.
Keywords :
image resolution; microscopy; millimetre wave imaging; plasma diagnostics; radar imaging; EHF; MM-wave focal plane imaging; MM-wave scanning near-field microscopy; millimeter wave imaging technologies; passive imaging; radiometric imaging; resolution; Adaptive optics; Image recognition; Image resolution; Millimeter wave communication; Millimeter wave measurements; Millimeter wave radar; Millimeter wave technology; Optical distortion; Optical imaging; Plasma measurements;
Conference_Titel :
Microwave Conference, 2001. APMC 2001. 2001 Asia-Pacific
Conference_Location :
Taipei, Taiwan
Print_ISBN :
0-7803-7138-0
DOI :
10.1109/APMC.2001.985394
