Title :
Device architecture for terahertz characterization of organic electro-optic ultra-thin films using time-domain attenuated total reflection method
Author :
Wenwei Jin; Ruimin Xu
Author_Institution :
EHF Key Laboratory of Fundamental Science, University of Electronic Science and Technology of China, Chengdu 611731, China
Abstract :
We developed a new device architecture for characterizing the properties of electro-optic (EO) material from the thin-film device utilizing time-domain attenuated total reflection spectroscopy in the terahertz (THz) frequency region. The properties of the test material showed good agreement with the results from pellets measurements by conventional THz-TDS system.
Keywords :
"Optical films","Optical reflection","Optical pulses","Instruments","Polymers"
Conference_Titel :
Communication Problem-Solving (ICCP), 2015 IEEE International Conference on
Print_ISBN :
978-1-4673-6543-7
DOI :
10.1109/ICCPS.2015.7454230
