DocumentCode :
376962
Title :
A thermally efficient structure of InGaP/GaAs hetero-junction bipolar transistor for power amplifier applications
Author :
Lee, Y.S. ; Park, C.S.
Author_Institution :
Sch. of Eng., Inf. & Commun. Univ., Taejon, South Korea
Volume :
1
fYear :
2001
fDate :
2001
Firstpage :
264
Abstract :
Designed several structures of InGaP/GaAs HBTs in accord with permitted limit of fabricating process, and analyzed their performance in the aspect of thermal limitation and power density. Simulated thermal distribution of the structure composed of 1 base with 2 emitter fingers compared with the structure composed of 2 bases with 1 emitter finger. The structure composed of 1 base with 2 emitters has several advantages in thermal behaviour and high power application. The simulation result of thermal distribution shows that one unit cell composed of 1 base with 2 emitters has lower maximum temperature than that composed of 2 bases with 1 emitter by 12 K. Measured negative resistance in IC-V CE plot of unit cell composed of 2 bases with 1 emitter is larger than the unit cell composed of 1 base with 2 emitters by 1.41 times. Also array with three unit cells composed of 2 bases with 1 emitter shows current gain collapse at VCE of 8 V while the array with three unit cells composed of 1 base with 2 emitter does not show current gain collapse in the same bias condition. The unit cell of InGaP/GaAs HBT composed of 1 base with 2 emitters shows better thermal properties and power performance
Keywords :
MMIC power amplifiers; bipolar MMIC; circuit simulation; gallium arsenide; gallium compounds; heterojunction bipolar transistors; indium compounds; negative resistance; temperature distribution; 8 V; InGaP-GaAs; InGaP/GaAs; bias condition; current gain collapse; emitter fingers; fabricating process; hetero-junction bipolar transistor; high power application; maximum temperature; microwave amplifier applications; negative resistance; power amplifier applications; power density; simulation result; thermal behaviour; thermal distribution; thermal limitation; thermally efficient structure; Bipolar transistors; Fingers; Gallium arsenide; Global warming; Heterojunction bipolar transistors; Power amplifiers; Power generation; Temperature distribution; Thermal conductivity; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2001. APMC 2001. 2001 Asia-Pacific
Conference_Location :
Taipei
Print_ISBN :
0-7803-7138-0
Type :
conf
DOI :
10.1109/APMC.2001.985637
Filename :
985637
Link To Document :
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