• DocumentCode
    3769708
  • Title

    A high stability silicon/silicon-dioxide capacitor

  • Author

    O. J. Wied;R. W. Young

  • Author_Institution
    Sprague Electric Co., North Adams, Mass
  • fYear
    1962
  • Firstpage
    190
  • Lastpage
    191
  • Abstract
    Investigations originally stimulated by an interest in the passivation of silicon surfaces have culminated in a high stability capacitor with a silicon-dioxide thin film as the dielectric. This paper presents some characteristics of the silicon-dioxide thin film alone, and of a silicon/silicon-dioxide capacitor. The capacitor can exhibit either a highly stable capacitance or a capacitance which is frequency and bias-variant, depending on the resistivity and conductivity type of silicon used.
  • Keywords
    "Films","Silicon","Capacitors","Capacitance","Substrates","Humidity","Conductivity"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation Conference Materials and Application, 1962. EIC 1962. EI
  • Print_ISBN
    978-1-5090-3103-0
  • Type

    conf

  • DOI
    10.1109/EIC.1962.7456077
  • Filename
    7456077