DocumentCode :
37703
Title :
Parallel Averaging for Thermal Noise Mitigation in MEMS Electrothermal Displacement Sensors
Author :
Mohammadi, Ali ; Moheimani, S.O.R. ; Yuce, Mehmet Rasit
Author_Institution :
Dept. of Electr. & Comput. Syst. Eng., Monash Univ., Clayton, VIC, Australia
Volume :
24
Issue :
1
fYear :
2015
fDate :
Feb. 2015
Firstpage :
4
Lastpage :
6
Abstract :
The sensitivity of an electrothermal displacement sensor increases with its temperature, whereas a higher temperature range leads to higher thermal noise level, which imposes a tradeoff on the sensor´s achievable resolution. We have developed a multiple sensor displacement measurement technique on a 1-degree-of-freedom silicon-on-insulator microelectromechanical systems nanopositioner that mitigates the mentioned tradeoff. To obtain maximum improvement, it is necessary to supply equal power to all of the sensors to ensure equal sensitivity. By combining three identical sensors, we have successfully achieved a 4-dB improvement in signal-to-noise ratio, which is in a good agreement with the averaging theory. Experiments show that the displacement resolution is improved from 0.3 to 0.15 nm/√(Hz) in the prototype nanopositioner. Furthermore, improvement is possible by increasing the number of sensors around the stage.
Keywords :
displacement measurement; microsensors; nanopositioning; nanosensors; silicon-on-insulator; thermal noise; MEMS electrothermal displacement sensor; degree-of-freedom; microelectromechanical systems nanopositioner; parallel averaging theory; prototype nanopositioner; sensor displacement measurement technique; signal-to-noise ratio; silicon-on-insulator; thermal noise level mitigation; Nanopositioning; Noise; Sensor phenomena and characterization; Temperature sensors; Thermal noise; Electrothermal sensor; averaging; averaging, nanopositioning; microelectromechanical systems (MEMS); nanopositioning; thermal noise;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2014.2364588
Filename :
6954426
Link To Document :
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