Title :
Contaminant effects on semiconductor devices
Author :
T. Scharr;R. Thomas;J. Jackson
Author_Institution :
Motorola Semiconductor Products Division, Materials Research Laboratory, Phoenix, Arizona 85008, USA
Abstract :
A significant fraction of semiconductor devices utilize organic materials for passivation and/or encapsulation. However, we are far from understanding the effect of chemical composition and structure of these materials on device reliability during high temperature electrical stress testing. The selection of junction coating resins has remained an empirical art.
Keywords :
"Surface treatment","Chemicals","Compounds","Semiconductor devices","Coatings","Silicon","Degradation"
Conference_Titel :
Electrical/Electronics Insulation Conference, 1975 EIC 12th
Print_ISBN :
978-1-5090-3111-5
DOI :
10.1109/EIC.1975.7458492
