• DocumentCode
    3771276
  • Title

    Measurement of dc dielectric conductance (reciprocal resistance) at elevated temperature

  • Author

    Arnold H. Scott

  • Author_Institution
    National Bureau of Standards, Washington, District of Columbia 20234, USA
  • fYear
    1965
  • Firstpage
    252
  • Lastpage
    254
  • Abstract
    The general principles given in ASTM D 257(1) apply to measurements of dielectric conductance at elevated temperatures. However, special precautions must be taken in the design of the cell or holder and the measuring circuit to insure that the supporting insulator conductances are Iow enough so that they do not appreciably affect the instrument indication when the conductance of a specimen is being measured. This includes conductance between the measuring electrode and the guard ring when volume conductance is being measured. This generally requires that the supporting insulators for the measuring electrode be Iocated outside the heated area. lt is possible to have the supporting insulators in the heated area if special insulating materials are used and special care is taken to have long lengths of insulators with relatively small cross section. Surface conductance usually has little meaning at elevated temperatures.
  • Keywords
    "Temperature measurement","Instruments","Current measurement","Electrical resistance measurement","Pollution measurement","Dielectric measurement","Dielectrics"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation Conference, 1965 Sixth
  • Print_ISBN
    978-1-5090-3105-4
  • Type

    conf

  • DOI
    10.1109/EIC.1965.7461241
  • Filename
    7461241