DocumentCode
3771503
Title
A four rod embedded electrode test
Author
R. B. Feuchtbaum
Author_Institution
Hughes Aircraft Company, Culver City, California
fYear
1963
Firstpage
147
Lastpage
149
Abstract
It has been amply demonstrated (1, 2, 3) that exposure to oxygen-containing environments above temperatures of 150°C will cause most of the commonly used electrical insulating materials to deteriorate (see Figure 1). Since many of these insulations are used in hermetic structures, life test data based on air aging could be misleading. The emphasis on space electronics in present-day technologies must also place important stress on performing measurements in a closely controlled environment simulating space conditions.
Keywords
"Dielectric measurement","Temperature measurement","Capacitance","Capacitance measurement","Electrical resistance measurement","Dielectrics","Insulation"
Publisher
ieee
Conference_Titel
Electrical Insulation Conference Materials and Application, 1963 EI
Print_ISBN
978-1-5090-3104-7
Type
conf
DOI
10.1109/EIC.1963.7461769
Filename
7461769
Link To Document