• DocumentCode
    3771503
  • Title

    A four rod embedded electrode test

  • Author

    R. B. Feuchtbaum

  • Author_Institution
    Hughes Aircraft Company, Culver City, California
  • fYear
    1963
  • Firstpage
    147
  • Lastpage
    149
  • Abstract
    It has been amply demonstrated (1, 2, 3) that exposure to oxygen-containing environments above temperatures of 150°C will cause most of the commonly used electrical insulating materials to deteriorate (see Figure 1). Since many of these insulations are used in hermetic structures, life test data based on air aging could be misleading. The emphasis on space electronics in present-day technologies must also place important stress on performing measurements in a closely controlled environment simulating space conditions.
  • Keywords
    "Dielectric measurement","Temperature measurement","Capacitance","Capacitance measurement","Electrical resistance measurement","Dielectrics","Insulation"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation Conference Materials and Application, 1963 EI
  • Print_ISBN
    978-1-5090-3104-7
  • Type

    conf

  • DOI
    10.1109/EIC.1963.7461769
  • Filename
    7461769