DocumentCode :
3771503
Title :
A four rod embedded electrode test
Author :
R. B. Feuchtbaum
Author_Institution :
Hughes Aircraft Company, Culver City, California
fYear :
1963
Firstpage :
147
Lastpage :
149
Abstract :
It has been amply demonstrated (1, 2, 3) that exposure to oxygen-containing environments above temperatures of 150°C will cause most of the commonly used electrical insulating materials to deteriorate (see Figure 1). Since many of these insulations are used in hermetic structures, life test data based on air aging could be misleading. The emphasis on space electronics in present-day technologies must also place important stress on performing measurements in a closely controlled environment simulating space conditions.
Keywords :
"Dielectric measurement","Temperature measurement","Capacitance","Capacitance measurement","Electrical resistance measurement","Dielectrics","Insulation"
Publisher :
ieee
Conference_Titel :
Electrical Insulation Conference Materials and Application, 1963 EI
Print_ISBN :
978-1-5090-3104-7
Type :
conf
DOI :
10.1109/EIC.1963.7461769
Filename :
7461769
Link To Document :
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