Title :
A microstrip slotted line for microwave two-port device characterization
Author :
J. P. Quine;J. G. McMullen;N. T. Lavoo
Author_Institution :
Corporate Research and Development, General Electric Company, Schenectady, New York 12345
Abstract :
The electrical and mechanical design of a micro-strip slotted line will be described. By means of this line, large-signal input and output impedances, gain and conversion efficiency of two-port bipolar transistor, FET and CATT devices can be measured as a function of frequency and power level. Measurements with the new microstrip slotted line can be performed much more quickly and accurately than with the conventional method.
Keywords :
"Microstrip","Impedance","Probes","Gain","Tuners","Gain measurement","Impedance measurement"
Conference_Titel :
Electrical/Electronics Insulation Conference, 1977 EIC 13th
Print_ISBN :
978-1-5090-3112-2
DOI :
10.1109/EIC.1977.7461908
