Title :
Memory effects in thin film negative resistance structures
Author :
N. M. Bashara;P. H. Nielsen
Author_Institution :
Department of Electrical Engineering, University of Nebraska, Lincoln, United States
Abstract :
Thin film sandwich structures containing a dielectric layer of silicon monoxide approximately 300 to 1000 Å thick between gold electrodes show a low frequency negative differential resistance, Figures 1-a and 1-a´. Hickmott has observed a low frequency negative resistance in a wide variety of sandwich structures.
Keywords :
"Resistance","Voltage measurement","Temperature","Electrical resistance measurement","Electric potential","Sandwich structures","Electrodes"
Conference_Titel :
Electrical Insulation, Annual Report 1963 Conference on
Print_ISBN :
978-1-5090-3119-1
DOI :
10.1109/EIC.1963.7466544
