DocumentCode :
3772976
Title :
The relationship of molecular structure to the properties of solid dielectrics
Author :
C. R. Vail
Author_Institution :
Department of Electrical Engineering Duke University, Durham, N. C.
fYear :
1960
Firstpage :
156
Lastpage :
158
Abstract :
For centuries, matter has been understood by man largely in terms of its gross, macroscopic properties. To the electrical engineer this has usually meant such properties as resistivity, permeability, permittivity, and dielectric strength. Engineering design calculations have traditionally been based on tables of experimentally-derived “average” values of such properties. The limitations of the materials described in such tables have, in a major way, delineated the frontiers of engineering achievement to date.
Keywords :
"Crystals","Solids","Lattices","Charge carriers","Electric fields","Heating","Metals"
Publisher :
ieee
Conference_Titel :
Application of Electrical Insulation, 1960 EI National Conference on the
Print_ISBN :
978-1-5090-3102-3
Type :
conf
DOI :
10.1109/ENCAEI.1960.7466630
Filename :
7466630
Link To Document :
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