Title :
The dielectric properties of liquids under a small dc bias
Author_Institution :
Thomas A. Edison Research Laboratory, McGraw-Edison Company, West Orange, New Jersey, United States
Abstract :
It is possible to measure capacitances and loss tangents at 100 c.p.s. under dc stresses of at least 4-7 volts/mil and to obtain results equivalent to those for the same material with less initial ionic impurities.
Keywords :
"Stress","Liquids","Capacitance","Temperature measurement","Dielectric loss measurement","Loss measurement","Purification"
Conference_Titel :
Electrical Insulation, Annual Report 1962 Conference on
Print_ISBN :
978-1-5090-3118-4
DOI :
10.1109/EIC.1962.7466660
