DocumentCode :
3773018
Title :
High temperature ion implanter for SiC and Si devices
Author :
Naoya Takahashi;Suguru Itoi;Yoshiki Nakashima;WeiJiang Zhao;Hiroshi Onoda;Shigeki Sakai
Author_Institution :
575, Kuze-Tonoshiro-Cho, Minami-Ku, Kyoto, 601-8205 Japan
fYear :
2015
fDate :
6/1/2015 12:00:00 AM
Firstpage :
6
Lastpage :
7
Abstract :
SiC wafers are often used for making high level power electronic devices, such as SiC-MOS devices or SiC-IGBTs. Ion implantation is an essential process for making these high level power electronic devices. High temperature implanter called IMPHEAT® is developed to implant ions such as Aluminum, Boron, Phosphine and others into SiC wafers while heating the SiC wafers to high temperature like 500oC. Some of the characteristics of IMPHEAT® and the high temperature implanter EXCEED® has been introduced in this paper.
Keywords :
"Silicon carbide","Plasma temperature","Temperature measurement","Implants","Silicon","Heating","Temperature"
Publisher :
ieee
Conference_Titel :
Junction Technology (IWJT), 2015 15th International Workshop on
Type :
conf
DOI :
10.1109/IWJT.2015.7467062
Filename :
7467062
Link To Document :
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