A Hardened Phase-Locked Loop Using Novel Charge Pump

A radiation-hardened phase-locked loop (PLL) has been proposed in which a novel numerical control restrain (NCR) circuit is applied in charge pump (CP) to reduce the control voltage perturbation and the recovery time caused by the single energetic particle strikes. A PLL based on this technique was design with 130nm CMOS process and the corresponding shows that the peak of voltage perturbation reduces by up to 80% and the recovery time reduces by up to 50% by employing this technique compared with the traditional one.