DocumentCode
377638
Title
Bunch length measurements at the TESLA Test Facility using a streak camera
Author
Honkavaara, K. ; Piot, Ph ; Schreiber, S. ; Sertore, D.
Author_Institution
DESY, Hamburg, Germany
Volume
3
fYear
2001
fDate
2001
Firstpage
2341
Abstract
A streak camera provides a direct and convenient way to measure bunch lengths in the millimeter and submillimeter range. At the TESLA Test Facility (TTF) a streak camera with a subpicosecond resolution is in operation. A bunch compressor is used to produce bunch lengths down to 250 μm for the operation of the TTF free electron laser. Bunch length measurements are presented and compared with simulations
Keywords
electron accelerators; linear accelerators; particle beam bunching; particle beam diagnostics; streak cameras; 250 micron; TESLA Test Facility; TTF; bunch compressor; bunch lengths; free electron laser; streak camera; Acceleration; Cameras; Cathodes; Free electron lasers; Length measurement; Linear particle accelerator; Phase measurement; Pulse measurements; Testing; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
Conference_Location
Chicago, IL
Print_ISBN
0-7803-7191-7
Type
conf
DOI
10.1109/PAC.2001.987372
Filename
987372
Link To Document