Title :
Monitoring and manipulation of sub-picosecond beams
Author :
Rosenzweig, J.B.
Author_Institution :
Dept. of Phys. & Astron., California Univ., Los Angeles, CA, USA
Abstract :
In cutting-edge applications such as advanced accelerators and free-electron lasers, very high brightness beams of duration shorter than a picosecond are required. Further, these applications demand specific types of longitudinal beam profiles, such as pulse trains, and ramped pulses. The production of such types of beams present challenges both in technique, and in the instrumentation required to verify the method employed. The techniques for producing such short beams which have received the most investigation in recent years include chicane compression, and modulation via free-electron laser mechanism and its inverse. We discuss the principles and relevant single particle and collective effects which impact their performance. We review progress in implementing these schemes, as well as newer concepts such as relativistic velocity bunching and use of negative R56 compressors. We also discussed the challenges in diagnosing these state-of-the-art beam systems
Keywords :
free electron lasers; particle beam bunching; particle beam diagnostics; particle beam injection; photocathodes; relativistic electron beams; RF photoinjector sources; advanced accelerators; chicane compression; collective effects; cutting-edge applications; deflecting mode cavity; electron beams; free-electron lasers; instrumentation; longitudinal beam profiles; magnetic compressors; negative R56 compressors; pulse trains; radiofrequency wavelength; ramped pulses; relativistic velocity bunching; state-of-the-art beam systems; subpicosecond beam manipulation; subpicosecond beam monitoring; very high brightness beams; Brightness; Compressors; Free electron lasers; Instruments; Laser beam cutting; Laser beams; Monitoring; Optical modulation; Particle beams; Production;
Conference_Titel :
Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-7191-7
DOI :
10.1109/PAC.2001.987442