DocumentCode
3777274
Title
Using FTracer to characterize an I/O-intensive application
Author
Wenrui Dong; Guangming Liu; Jie Yu; You Zuo
Author_Institution
School of Computer Science, National University of Defense Technology, Changsha, Hunan, China
Volume
1
fYear
2015
Firstpage
324
Lastpage
327
Abstract
I/O characteristics are vital to application development and orchestration of storage system. Users and system managers usually perform I/O optimizations to applications and file systems according to I/O characteristics of parallel applications. In this paper, we first investigate the overhead of FTracer, which is a I/O characterizing tool proposed in our previous work. Then we tune the parameters of FTracer to reduce the overhead incurred by FTracer. And, we use FTracer to analyze the I/O characteristics of an I/O intensive application called Trace Gather. The results of analysis include two levels of information, file level and node level. They are all useful for further I/O optimization of Trace Gather.
Keywords
"Fuses","Supercomputers","Writing","Optimization","Runtime","Kernel","Computer science"
Publisher
ieee
Conference_Titel
Computer Science and Network Technology (ICCSNT), 2015 4th International Conference on
Type
conf
DOI
10.1109/ICCSNT.2015.7490761
Filename
7490761
Link To Document