• DocumentCode
    3777778
  • Title

    A resource approach to on-line testing of computing circuits

  • Author

    J. Drozd;A. Drozd;M. Al-dhabi

  • Author_Institution
    Odessa National Polytechnic University, Odessa, Ukraine
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper is devoted to the development of on-line testing the digital circuits of arithmetic units. Analysis of the development is done using the resource approach, which considers the adaptation of the computer world to the features of natural world, including the parallelism and fuzziness. Resource approach justifies the transition of on-line testing from the formation stage, which took place under the sign of the self-checking circuit development in the framework of the exact data processing, to the modern stage, distributing on-line testing for approximate calculations. Resource approach offers the methods of multiple effect including the method of preparing the results that increases the efficiency of on-line testing in both reliability and simplification of the error detection circuits. The increase in the level of resource development leads to multi-threaded data processing on the bitwise pipelines and their scan checking.
  • Keywords
    "Testing","Integrated circuit reliability","Circuit faults","Parallel processing","Throughput","Digital circuits"
  • Publisher
    ieee
  • Conference_Titel
    East-West Design & Test Symposium (EWDTS), 2015 IEEE
  • Type

    conf

  • DOI
    10.1109/EWDTS.2015.7493122
  • Filename
    7493122