DocumentCode
3777785
Title
Fault-tolerant high performance scheme design
Author
A. Matrosova;S. Ostanin;I. Kirienko;E. Nikolaeva
Author_Institution
Department of Applied Mathematics and Cybernetics, Tomsk State University, Tomsk, Russia
fYear
2015
Firstpage
1
Lastpage
4
Abstract
Extending a set of faults on account of path delay ones (PDFs) for the fault-tolerant scheme previously oriented to transient or intermittent single stuck-at faults at gate poles of a synchronous sequential circuit is suggested. PDFs are also either transient or intermittent faults. The scheme is based on replicating a self-checking synchronous sequential circuit and using a checker for one of the circuit. We don´t need to provide a self-testing property for the checker. It is supposed that each next fault appears when a previous one has disappeared. Estimations of the scheme complexity, and its modification oriented to masking only PDFs are discussed.
Keywords
"Circuit faults","Delays","Logic gates","Sequential circuits","Fault tolerance","Fault tolerant systems","Transient analysis"
Publisher
ieee
Conference_Titel
East-West Design & Test Symposium (EWDTS), 2015 IEEE
Type
conf
DOI
10.1109/EWDTS.2015.7493129
Filename
7493129
Link To Document