• DocumentCode
    3777785
  • Title

    Fault-tolerant high performance scheme design

  • Author

    A. Matrosova;S. Ostanin;I. Kirienko;E. Nikolaeva

  • Author_Institution
    Department of Applied Mathematics and Cybernetics, Tomsk State University, Tomsk, Russia
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Extending a set of faults on account of path delay ones (PDFs) for the fault-tolerant scheme previously oriented to transient or intermittent single stuck-at faults at gate poles of a synchronous sequential circuit is suggested. PDFs are also either transient or intermittent faults. The scheme is based on replicating a self-checking synchronous sequential circuit and using a checker for one of the circuit. We don´t need to provide a self-testing property for the checker. It is supposed that each next fault appears when a previous one has disappeared. Estimations of the scheme complexity, and its modification oriented to masking only PDFs are discussed.
  • Keywords
    "Circuit faults","Delays","Logic gates","Sequential circuits","Fault tolerance","Fault tolerant systems","Transient analysis"
  • Publisher
    ieee
  • Conference_Titel
    East-West Design & Test Symposium (EWDTS), 2015 IEEE
  • Type

    conf

  • DOI
    10.1109/EWDTS.2015.7493129
  • Filename
    7493129