• DocumentCode
    3777993
  • Title

    Research for effect of dirt defect of quartz wafer on its electrical parameters

  • Author

    Li Dong; Wang Yanlin; Liu Gang; Song Peiji

  • Author_Institution
    Beijing Key Laboratory on Measurement and Control of Mechanical & Electrical System, Beijing Information Science and Technology University, 100192, China
  • Volume
    1
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    105
  • Lastpage
    108
  • Abstract
    Research the effect of dirt of quartz wafer on its electrical parameters. Experimental and theoretical analysis results show that the dirt of quartz wafer affects its mass, elastic modulus and vibration damping, and leads to increase of dynamic inductance, decrease of dynamic capacitance, reduction of resonant frequency and increase of resonance resistance. Effect of the dirt on the electrical parameters of quartz wafer is related to not only its magnitude, but also its location, materials and other factors.This study on quartz wafer appearance defects for improving the quartz wafer automatic sorting technology in our country and setting up the unified and objective testing standards of quartz wafer has important significance.
  • Keywords
    "Resonant frequency","Crystals","Resistance","Mathematical model","Instruments","Stability analysis","Semiconductor device modeling"
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement & Instruments (ICEMI), 2015 12th IEEE International Conference on
  • Type

    conf

  • DOI
    10.1109/ICEMI.2015.7494214
  • Filename
    7494214