• DocumentCode
    3778034
  • Title

    Research and implementation of boundary scan test system based on EDIF

  • Author

    Chen Shouhong; Hou Xingna; Wang Zhuang; Yan Xuelong; Xu Chuanpei

  • Author_Institution
    Guilin University of Electronic Technology, Guangxi Key Laboratory of Automatic Detecting Technology and Instruments, Jingji Road No.1, China, 541004
  • Volume
    1
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    218
  • Lastpage
    222
  • Abstract
    Boundary scan test technology with its unique ?virtual probe? characteristic provides a powerful means to solve the difficult problem of high density integrated test system components. It introduces the development of a more general boundary scan test system based on EDIF (Electronic Design Interchange Format). The hardware of the system is based on USB bus, including the PC, USB driver interface, the boundary scan test bus controller, test access port JTAG bus; software is based on XP system, through the Visual Studio 2008 as the programming environment, using SQLite3 database manages test module data. The test system can achieve the test and fault diagnosis. Finally the future development trend of boundary scan test technology is analyzed.
  • Keywords
    "Standards","Hardware","Software","Testing","Fault diagnosis","Maintenance engineering","Circuit faults"
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement & Instruments (ICEMI), 2015 12th IEEE International Conference on
  • Type

    conf

  • DOI
    10.1109/ICEMI.2015.7494256
  • Filename
    7494256
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3778034