DocumentCode :
377806
Title :
Beam-size measurements on PEP-II using synchrotron-light interferometry
Author :
Fisher, A.S. ; Holtzapple, R.L. ; Petree, M. ; Bong, E.L.
Author_Institution :
SLAC Collaboration, Stanford Univ., CA, USA
Volume :
1
fYear :
2001
fDate :
2001
Firstpage :
547
Abstract :
PEP-II transverse profiles are measured by imaging visible synchrotron light from dipoles in the two rings. The images are broadened by surface errors on the primary extraction mirrors, which have a complex design due to high beam currents. To improve vertical beam-size measurements, we installed a synchrotron-light interferometer, following Mitsuhashi at KEK. In a two-slit interferometer, fine fringes modulate the single-slit pattern from a point source. As the source size increases, the fringe depth decreases, providing a sensitive tool. Because the slits pass light from two stripes along the mirror, we can select the better parts of its surface. By adding a cylindrical lens to image the mirror in the direction perpendicular to the fringes, we can further select short segments of these stripes. In 2000, we put an interferometer on the low-energy ring, at a point 30 m from the BaBar detector, where the beam ellipse is tilted as we compensate for rotation in BaBar´s solenoid. Our interferometer turns to measure the beam tilt. More recently we added a second unit for the high-energy ring. All optics are in the PEP tunnel and allow remote adjustment of the focusing, slit width and separation
Keywords :
X-ray production; colliding beam accelerators; electromagnetic wave interferometry; electron accelerators; electron beam focusing; electron beams; particle beam diagnostics; particle beam extraction; size measurement; storage rings; 30 m; PEP-II; beam-size measurements; cylindrical lens; electron storage ring; fine fringes; focusing; high-energy ring; low-energy ring; primary extraction mirrors; single-slit pattern; surface errors; synchrotron-light interferometry; transverse profiles; two-slit interferometer; vertical beam-size measurements; Coherence; Diffraction; Electron beams; Lenses; Mirrors; Optical filters; Optical interferometry; Optical modulation; Optical surface waves; Size measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-7191-7
Type :
conf
DOI :
10.1109/PAC.2001.987565
Filename :
987565
Link To Document :
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