DocumentCode :
3778155
Title :
An OTDR event analysis algorithm based on EMD-based denoising and wavelet transform
Author :
Han Qiang; Zhang Zhihui; Wang Dongsheng; Liu Lei; Hou Xibao
Author_Institution :
Science and Technology on Electronic Test &
Volume :
2
fYear :
2015
fDate :
7/1/2015 12:00:00 AM
Firstpage :
1034
Lastpage :
1038
Abstract :
In order to improve the events analysis performance of optical time domain reflectometer (OTDR), locate the events accuracy and speedy, a new event analysis algorithm is particularly needed. Since OTDR signal contains nonstationary noise and the events can be seen as singularities, we presented an algorithm based on Empirical Mode Decomposition (EMD) and wavelet transform. Firstly using EMD to denoise the signal and then detecting the singularities by wavelet transform. This algorithm combines the advantage of EMD and wavelet transform. Experimental results show that this algorithm can detect and locate OTDR events effectively, and has great application value.
Keywords :
"Noise reduction","Wavelet analysis","Signal processing algorithms","Discrete wavelet transforms","Algorithm design and analysis"
Publisher :
ieee
Conference_Titel :
Electronic Measurement & Instruments (ICEMI), 2015 12th IEEE International Conference on
Type :
conf
DOI :
10.1109/ICEMI.2015.7494379
Filename :
7494379
Link To Document :
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