DocumentCode
3778485
Title
Mathematical model of point events in CCD images
Author
Guillermo Fernandez Moroni;Miguel Sofo Haro;Javier Tiffenberg;Gustavo Cancelo;Eduardo E. Paolini;Juan Estrada;Xavier Bertou
Author_Institution
Instituto de Inv. Ing. El?ctrica (IIIE), CONICET-Universidad del Sur, Bah?a Blanca, Argentina
fYear
2015
Firstpage
1
Lastpage
6
Abstract
In this article a stochastic model for point events expected in the output image of scientific CCDs is derived. This kind of events are typical in CCD systems dedicated to particle detection, such as DAMIC and CONNIE. The model includes the randomness of the charge movement in the silicon and the noise at the readout stage providing the base for an optimal detection technique.
Keywords
"Mathematical model","Charge coupled devices","Silicon","Photonics","Correlation","Neutrino sources","Substrates"
Publisher
ieee
Conference_Titel
Information Processing and Control (RPIC), 2015 XVI Workshop on
Type
conf
DOI
10.1109/RPIC.2015.7497157
Filename
7497157
Link To Document