Beam lifetime of the Pohang Light Source

Author

Kim, M.G. ; Park, C.D. ; Park, E.S. ; Lee, T.Y.

Author_Institution

Pohang Accelerator Lab., South Korea

Volume

4

fYear

2001

fDate

2001

Firstpage

2650

Abstract

Like other third generation light sources, the main contributions to the beam lifetime of the Pohang Light Source comes from beam-gas scattering and the Touschek effect. The beam-gas scattering lifetime is measured with an extremely low stored current in the long train of bunches. By investigating the vertical gap dependence of the beam-gas scattering lifetime, it is possible to decompose the beam-gas scattering lifetime to the elastic and inelastic parts. On the other hand, the Touschek lifetime is analyzed using the graph of the measured beam lifetime as a function of time. It is used that the rate of change of the pure Touschek lifetime is exactly 1. The deviation from 1 is caused by the beam-gas scattering effect and the radiative electron beam polarization. By analyzing the graph, it is possible to estimate the beam-gas scattering lifetime and the polarization contribution to the beam lifetime

Keywords

X-ray production; electron accelerators; particle beam diagnostics; storage rings; Pohang Light Source; Touschek effect; beam lifetime; beam-gas scattering lifetime; radiative electron beam polarization; Apertures; Current measurement; Electron beams; Laboratories; Lattices; Light scattering; Light sources; Optical polarization; Particle scattering; Time measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001

Conference_Location

Chicago, IL

Print_ISBN

0-7803-7191-7

Type

conf

DOI

10.1109/PAC.2001.987861

Filename

987861