DocumentCode :
37795
Title :
Formal Guarantees for Localized Bug Fixes
Author :
Mitra, Subhasish ; Banerjee, Adrish ; Dasgupta, Parthasarathi ; Ghosh, Prosenjit ; Kumar, Harish
Author_Institution :
Dept. of Comput. Sci. & Eng., IIT Kharagpur, Kharagpur, India
Volume :
32
Issue :
8
fYear :
2013
fDate :
Aug. 2013
Firstpage :
1274
Lastpage :
1287
Abstract :
Bug traces produced in simulation serve as the basis for patching the RTL code in order to fix a bug. It is important to prove that the patch covers all instances of the bug scenario; otherwise, the bug may return with a different valuation of the variables involved in the bug scenario. For large circuits, formal methods do not scale well enough to comprehensively eliminate the bug, and achieving adequate coverage in simulation and regression testing becomes expensive. This paper proposes formal methods for analyzing the control trace leading to the observed manifestation of the bug and verifying the robustness of the bug fix with respect to that control trace. We propose a classification of the bug fix based on the guarantee that our analysis can provide about the quality of the bug fix. Our method also prescribes the types of tests that are recommended to validate the bug fix on other types of scenarios. Since our methods are more scalable by orders of magnitude than model checking the entire design, we believe that the proposed formal methods hold immense promise in analyzing bug fixes in practice.
Keywords :
computer debugging; electronic engineering computing; formal verification; RTL code; bug fix classification; bug fix quality; bug trace; bug verification; control trace; formal guarantees; formal method; localized bug fixes; model checking; regression testing; Buffer storage; Computational modeling; Cost accounting; Integrated circuit modeling; Process control; Random access memory; Robustness; Debugging; dynamic slicing; hardware verification; satisfiability;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2013.2252055
Filename :
6558891
Link To Document :
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