DocumentCode
37795
Title
Formal Guarantees for Localized Bug Fixes
Author
Mitra, Subhasish ; Banerjee, Adrish ; Dasgupta, Parthasarathi ; Ghosh, Prosenjit ; Kumar, Harish
Author_Institution
Dept. of Comput. Sci. & Eng., IIT Kharagpur, Kharagpur, India
Volume
32
Issue
8
fYear
2013
fDate
Aug. 2013
Firstpage
1274
Lastpage
1287
Abstract
Bug traces produced in simulation serve as the basis for patching the RTL code in order to fix a bug. It is important to prove that the patch covers all instances of the bug scenario; otherwise, the bug may return with a different valuation of the variables involved in the bug scenario. For large circuits, formal methods do not scale well enough to comprehensively eliminate the bug, and achieving adequate coverage in simulation and regression testing becomes expensive. This paper proposes formal methods for analyzing the control trace leading to the observed manifestation of the bug and verifying the robustness of the bug fix with respect to that control trace. We propose a classification of the bug fix based on the guarantee that our analysis can provide about the quality of the bug fix. Our method also prescribes the types of tests that are recommended to validate the bug fix on other types of scenarios. Since our methods are more scalable by orders of magnitude than model checking the entire design, we believe that the proposed formal methods hold immense promise in analyzing bug fixes in practice.
Keywords
computer debugging; electronic engineering computing; formal verification; RTL code; bug fix classification; bug fix quality; bug trace; bug verification; control trace; formal guarantees; formal method; localized bug fixes; model checking; regression testing; Buffer storage; Computational modeling; Cost accounting; Integrated circuit modeling; Process control; Random access memory; Robustness; Debugging; dynamic slicing; hardware verification; satisfiability;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2013.2252055
Filename
6558891
Link To Document