• DocumentCode
    3779649
  • Title

    Dielectric properties of Teflon from room temperature to 314°C and from frequencies of 102 to 105 c/s

  • Author

    P. Ehrlich;L. E. Amborski;R. L. Burton

  • Author_Institution
    National Bureau of Standards, Washington, D. C.
  • fYear
    1953
  • Firstpage
    28
  • Lastpage
    30
  • Abstract
    Measurements of dielectric constant, dielectric loss and d.c. conductivity of Teflon were made from room temperature to temperatures just below the 327°C first order transition point and from frequencies of 102 to 105 c/s on the high temperature sample holder described in the previous paper. Throughout this entire temperature and frequency range the dissipation factor never exceeds the smallest observable value, i.e., 2 ×10-4 and, consequently, there is no significant frequency dependence of the dielectric constant at any temperature. The d.c. conductivity is always less than its smallest observable value, i.e., 2 × 10-15 mho/cm, throughout this entire temperature range. The dielectric constant is computed to decrease from about 2.02 at 24°C to about 1.84 at 300°C. Its temperature dependence is in approximate agreement with values predicted from the experimental thermal expansion coefficient and the Clausius-Mosotti equation.
  • Keywords
    "Films","Conductivity","Temperature measurement","Temperature distribution","Dielectrics","Frequency measurement"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1953. annualReport 1953. Conference on
  • Print_ISBN
    978-1-5090-3130-6
  • Type

    conf

  • DOI
    10.1109/EIC.1953.7508671
  • Filename
    7508671