DocumentCode
3779649
Title
Dielectric properties of Teflon from room temperature to 314°C and from frequencies of 102 to 105 c/s
Author
P. Ehrlich;L. E. Amborski;R. L. Burton
Author_Institution
National Bureau of Standards, Washington, D. C.
fYear
1953
Firstpage
28
Lastpage
30
Abstract
Measurements of dielectric constant, dielectric loss and d.c. conductivity of Teflon were made from room temperature to temperatures just below the 327°C first order transition point and from frequencies of 102 to 105 c/s on the high temperature sample holder described in the previous paper. Throughout this entire temperature and frequency range the dissipation factor never exceeds the smallest observable value, i.e., 2 ×10-4 and, consequently, there is no significant frequency dependence of the dielectric constant at any temperature. The d.c. conductivity is always less than its smallest observable value, i.e., 2 × 10-15 mho/cm, throughout this entire temperature range. The dielectric constant is computed to decrease from about 2.02 at 24°C to about 1.84 at 300°C. Its temperature dependence is in approximate agreement with values predicted from the experimental thermal expansion coefficient and the Clausius-Mosotti equation.
Keywords
"Films","Conductivity","Temperature measurement","Temperature distribution","Dielectrics","Frequency measurement"
Publisher
ieee
Conference_Titel
Electrical Insulation, 1953. annualReport 1953. Conference on
Print_ISBN
978-1-5090-3130-6
Type
conf
DOI
10.1109/EIC.1953.7508671
Filename
7508671
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