FEM simulations of NFC certification tests in mobile phone environment

This paper presents a study for modelizing a Near Field Communication (NFC) technology integrated in a mobile device. It also proposes a simulation environment to perform NFC certification tests in reader-writer mode with the EMVCo (Europay Mastercard Visa Contactless) reference PICC (Proximity Integrated Circuit Card) called EMV-TEST PICC. This study is divided in 2 main parts. The first part is focused on the device under test (DUT) model. It consists of the antenna model and the ferrite inclusion followed by the chip output impedance characterization and the matching circuit model. The second part deals with the environment test and its model. This includes the coupling effect model with the reference device and a mobile phone simplified model finally followed by the power transfer test as define in EMVCo certification norm. Obviously, each study step is validated by comparing the simulated results with measurement ones.