• DocumentCode
    3780891
  • Title

    Electrical properties of titanium dioxide semiconductors

  • Author

    R. G. Breckenridge;W. R. Hosler

  • Author_Institution
    National Bureau of Standards, Washington, D. C.
  • fYear
    1950
  • Firstpage
    76
  • Lastpage
    79
  • Abstract
    The electrical properties of titanium dioxide semiconductors have been under study for several years.1,2,3,4 In general, however, the previous studies were only of the electrical conductivity of ceramics so that little information about the properties of the rutile lattice is available. Recently, however, synthetic rutile crystals have been placed on the market*, and an investigation of their electrical properties is of obvious Interest.
  • Keywords
    "Temperature measurement","Semiconductor device measurement","Crystals","Ceramics","Conductivity","Distortion measurement","Current measurement"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1950 Conference On
  • Print_ISBN
    978-1-5090-3127-6
  • Type

    conf

  • DOI
    10.1109/CEI.1950.7513614
  • Filename
    7513614