DocumentCode :
3780944
Title :
Design rule driven behavioral synthesis for test
Author :
S.N. Hamilton;T. Gonzalez;A. Orailoglu
Author_Institution :
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
Volume :
2
fYear :
1998
Firstpage :
1033
Abstract :
We have developed a new approach to behavioral synthesis for testability. Utilizing a VHDL transformation environment, we have distilled design rules for testable VHDL generation. Design rules can be linked to specific design for test techniques, allowing simplified exploration of BIST, partial scan, and other test approaches. The result is a design methodology which is simple to use, improves testability, and decreases time to market.
Keywords :
"Automatic testing","Built-in self-test","High level synthesis","Time to market","Hardware","Space exploration","Sequential analysis","Computer science","Production","Costs"
Publisher :
ieee
Conference_Titel :
Signals, Systems & Computers, 1998. Conference Record of the Thirty-Second Asilomar Conference on
ISSN :
1058-6393
Print_ISBN :
0-7803-5148-7
Type :
conf
DOI :
10.1109/ACSSC.1998.751419
Filename :
751419
Link To Document :
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