Title :
TLP evaluation of ESD protection capability of graphene micro-ribbons for ICs
Author :
Wei Zhang;Qi Chen;Ming Xia;Rui Ma;Fei Lu;Chenkun Wang;Albert Wang;Ya-Hong Xie
Author_Institution :
Department of Materials Science and Engineering, University of California, Los Angeles, CA 90095, USA
Abstract :
Transmission line pulse (TLP) measurements were carried out to study electrostatic discharge (ESD) protection capability of monolayer and bilayer graphene micro-ribbons (GR) as IC interconnects. For 100 ns pulse duration (td) and 10 ns pulse rise time (tr), the second breakdown TLP test current density limit reaches around 3.34 × 108 A/cm2 for monolayer GRs and 2.27 × 108 A/cm2 for bilayer GRs, which are both superior to that of Cu wires, commonly used as interconnects for CMOS ICs. This study of large number of sample splits provide design guidelines for on-chip ESD protection circuits using graphene interconnects for future ICs.
Keywords :
"Electrostatic discharges","Graphene","Integrated circuit interconnections","Transmission line measurements","Metals","Immune system"
Conference_Titel :
ASIC (ASICON), 2015 IEEE 11th International Conference on
Print_ISBN :
978-1-4799-8483-1
Electronic_ISBN :
2162-755X
DOI :
10.1109/ASICON.2015.7516901