DocumentCode
3781163
Title
TLP evaluation of ESD protection capability of graphene micro-ribbons for ICs
Author
Wei Zhang;Qi Chen;Ming Xia;Rui Ma;Fei Lu;Chenkun Wang;Albert Wang;Ya-Hong Xie
Author_Institution
Department of Materials Science and Engineering, University of California, Los Angeles, CA 90095, USA
fYear
2015
Firstpage
1
Lastpage
4
Abstract
Transmission line pulse (TLP) measurements were carried out to study electrostatic discharge (ESD) protection capability of monolayer and bilayer graphene micro-ribbons (GR) as IC interconnects. For 100 ns pulse duration (td) and 10 ns pulse rise time (tr), the second breakdown TLP test current density limit reaches around 3.34 × 108 A/cm2 for monolayer GRs and 2.27 × 108 A/cm2 for bilayer GRs, which are both superior to that of Cu wires, commonly used as interconnects for CMOS ICs. This study of large number of sample splits provide design guidelines for on-chip ESD protection circuits using graphene interconnects for future ICs.
Keywords
"Electrostatic discharges","Graphene","Integrated circuit interconnections","Transmission line measurements","Metals","Immune system"
Publisher
ieee
Conference_Titel
ASIC (ASICON), 2015 IEEE 11th International Conference on
Print_ISBN
978-1-4799-8483-1
Electronic_ISBN
2162-755X
Type
conf
DOI
10.1109/ASICON.2015.7516901
Filename
7516901
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