• DocumentCode
    3781163
  • Title

    TLP evaluation of ESD protection capability of graphene micro-ribbons for ICs

  • Author

    Wei Zhang;Qi Chen;Ming Xia;Rui Ma;Fei Lu;Chenkun Wang;Albert Wang;Ya-Hong Xie

  • Author_Institution
    Department of Materials Science and Engineering, University of California, Los Angeles, CA 90095, USA
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Transmission line pulse (TLP) measurements were carried out to study electrostatic discharge (ESD) protection capability of monolayer and bilayer graphene micro-ribbons (GR) as IC interconnects. For 100 ns pulse duration (td) and 10 ns pulse rise time (tr), the second breakdown TLP test current density limit reaches around 3.34 × 108 A/cm2 for monolayer GRs and 2.27 × 108 A/cm2 for bilayer GRs, which are both superior to that of Cu wires, commonly used as interconnects for CMOS ICs. This study of large number of sample splits provide design guidelines for on-chip ESD protection circuits using graphene interconnects for future ICs.
  • Keywords
    "Electrostatic discharges","Graphene","Integrated circuit interconnections","Transmission line measurements","Metals","Immune system"
  • Publisher
    ieee
  • Conference_Titel
    ASIC (ASICON), 2015 IEEE 11th International Conference on
  • Print_ISBN
    978-1-4799-8483-1
  • Electronic_ISBN
    2162-755X
  • Type

    conf

  • DOI
    10.1109/ASICON.2015.7516901
  • Filename
    7516901