Title :
A high-efficient and accurate fault model aiming at FPGA-based AES cryptographic applications
Author :
Nan Liao;Xiaoxin Cui;Tian Wang;Kai Liao;Yewen Ni;Dunshan Yu;Xiaole Cui
Author_Institution :
Institute of Microelectronics, Peking University, Beijing 100871, China
Abstract :
Setup time variation fault attacks that aim straightly at the FPGA devices have become hot spots nowadays. A high-efficient and accurate fault model aiming at FPGA-based cryptographic applications is proposed in this paper. Multi-diagonal faults are considered in this paper, thus more exploitable faulty ciphertexts can be gathered compared with the previous model. Multi-fault analysis is introduced due to the existence of multi-fault injection, which guarantees the accuracy of the result. Experiment result shows that the fault model brings a significant increase up to 36.5% of the exploitable faults compared with the previous method. Within 24 pairs of correct and faulty ciphertexts, the complete round key can be retrieved by this model.
Keywords :
"Circuit faults","Field programmable gate arrays","Algorithm design and analysis","Hardware","Encryption","Integrated circuit modeling"
Conference_Titel :
ASIC (ASICON), 2015 IEEE 11th International Conference on
Print_ISBN :
978-1-4799-8483-1
Electronic_ISBN :
2162-755X
DOI :
10.1109/ASICON.2015.7517030