DocumentCode :
3781269
Title :
A high efficiency all-PMOS charge pump for 3D NAND flash memory
Author :
Liyin Fu;Yu Wang;Qi Wang;Shiyang Yang;Yan Yang;Zongliang Huo
Author_Institution :
Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
fYear :
2015
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, an improved four-phase all PMOS charge pump based on the Pelliconi structure is proposed with high voltage boosting efficiency, strong driving capability and large power efficiency. The proposed charge pump uses a complementary structure to solve the voltage driving problem in the conventional charge pump structures. Two auxiliary substrate switching PMOS transistors are added to mitigate the PMOS body effect. The degradation of the output voltage and power efficiency caused by the high threshold voltage drop of high-voltage transistors is eliminated by means of dynamic gate control structure. The proposed charge pump is implemented in 2Xnm process of 3D V-NAND with all PMOS transistors. The simulation results show that the output voltage of proposed 9 stages charge pump can be reached to 23.24V, and the maximum power efficiency of 82.5% can be achieved with 20uA load current, under 20 MHz clock frequency for a power supply voltage of 3 V.
Keywords :
"Charge pumps","Boosting","Logic gates","Three-dimensional displays","Threshold voltage","MOSFET","Flash memories"
Publisher :
ieee
Conference_Titel :
ASIC (ASICON), 2015 IEEE 11th International Conference on
Print_ISBN :
978-1-4799-8483-1
Electronic_ISBN :
2162-755X
Type :
conf
DOI :
10.1109/ASICON.2015.7517041
Filename :
7517041
Link To Document :
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