• DocumentCode
    3781305
  • Title

    Ultra low power circuits design based on III-V group heterojunction tunnel field effect transistor

  • Author

    Jipan Huang;Fang Gao;Xin´an Wang;Hongying Chen

  • Author_Institution
    The Key Laboratory of Integrated Micro-systems Science and Engineering Applications, Peking University Shenzhen Graduate School, Shenzhen 518055, China
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    With the scaling down of MOSFET, the static leakage current increases exponentially since the Subthreshold Swing(SS) is limited by the thermal theory to 60mV/dec. Tunnel field effect transistors based on BTBT have slope Subthreshold Swing and can be used for low power applications. In this paper, InverterFO1, two-input XOR gates and SRAM cell based on III-V heterojunction TFET are designed and evaluated. Leakage power of TFET InverterFO1 decreased to 1.7%. Leakage power of SRAM cell obtains 76.3X improvements over 130nm CMOS commercial model at VDD=0.6V. Meanwhile, this paper talks about the effect of asymmetry Current of TFET to the topology structure of pass-transistor based circuits.
  • Keywords
    "TFETs","SRAM cells","CMOS integrated circuits","MOSFET","Circuit stability"
  • Publisher
    ieee
  • Conference_Titel
    ASIC (ASICON), 2015 IEEE 11th International Conference on
  • Print_ISBN
    978-1-4799-8483-1
  • Electronic_ISBN
    2162-755X
  • Type

    conf

  • DOI
    10.1109/ASICON.2015.7517090
  • Filename
    7517090