• DocumentCode
    3781375
  • Title

    Research of reusability based on UVM verification

  • Author

    Wei Ni;Jichun Zhang

  • Author_Institution
    Institute of VLSI Design, Hefei University of Technology, Hefei 230009, China
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    On the basis of analysis of UVM verification methodology, the research focuses on the reusability of UVM verification. The reusability in this paper is reflected in the reuse of verification component, verification platform, test cases and sequences. Firstly, a typical UVM verification platform is studied, then the reusability of UVM platform and test cases are discussed. Finally, a reusable verification platform based on the I2C protocol is designed and the result of verification is analyzed.
  • Keywords
    "Monitoring","Protocols","Production facilities","Standards","Time-varying systems","Time-domain analysis","Nickel"
  • Publisher
    ieee
  • Conference_Titel
    ASIC (ASICON), 2015 IEEE 11th International Conference on
  • Print_ISBN
    978-1-4799-8483-1
  • Electronic_ISBN
    2162-755X
  • Type

    conf

  • DOI
    10.1109/ASICON.2015.7517189
  • Filename
    7517189
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3781375