Some recent studies of random noise between metals and dielectrics

The purpose of these studies was to investigate the source of noise which is generated when thin dielectrics are subjected to relatively low D.C. voltages(1,2). If the measured noise voltage is caused by the movement of ions or electrons in the volume of the dielectric between electrodes as shown by Haworth and Bozorth(3), then a semi-quantitative measurement of this noise might be a means whereby prebreakdown avalanches could be studied.