3782069

ATPG tools for Delay Faults at the Functional Level *

S. Tragoudas;M. Michael

The Univerity of Arizona

1999

631

635

"Automatic test pattern generation","Delay","Circuit faults","Circuit testing","Boolean functions","Data structures","Approximation algorithms","Fault detection","Fiber reinforced plastics","Logic testing"

ieee

Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings

0-7695-0078-1

conf

10.1109/DATE.1999.761195

761195