• DocumentCode
    3782069
  • Title

    ATPG tools for Delay Faults at the Functional Level *

  • Author

    S. Tragoudas;M. Michael

  • Author_Institution
    The Univerity of Arizona
  • fYear
    1999
  • Firstpage
    631
  • Lastpage
    635
  • Keywords
    "Automatic test pattern generation","Delay","Circuit faults","Circuit testing","Boolean functions","Data structures","Approximation algorithms","Fault detection","Fiber reinforced plastics","Logic testing"
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings
  • Print_ISBN
    0-7695-0078-1
  • Type

    conf

  • DOI
    10.1109/DATE.1999.761195
  • Filename
    761195
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3782069