DocumentCode :
3782182
Title :
Testing analog circuits by supply voltage variation and supply current monitoring
Author :
Y. Kilic;M. Zwolinski
Author_Institution :
Southampton Univ., UK
fYear :
1999
Firstpage :
155
Lastpage :
158
Abstract :
A technique for sensitizing faults in analog circuits by varying the supply voltage and monitoring the supply current is discussed. The detection of short circuit faults is demonstrated with a simple CMOS circuit. The technique is applied to a larger analog circuit and significantly improved fault cover is obtained.
Keywords :
"Circuit testing","Analog circuits","Voltage","Current supplies","Monitoring","Circuit faults","Logic testing","Semiconductor device modeling","Switches","CMOS analog integrated circuits"
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits, 1999. Proceedings of the IEEE 1999
Print_ISBN :
0-7803-5443-5
Type :
conf
DOI :
10.1109/CICC.1999.777264
Filename :
777264
Link To Document :
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