Title :
A relationship between structural characteristics and noise properties of thick resistive films
Author :
I. Stanimirovic;M.M. Jevtic;Z. Stanimirovic
Author_Institution :
Telecommun. & Electron. Inst., Belgrade, Yugoslavia
Abstract :
A relationship between structural characteristics and noise properties of thick resistive films using noise reduced mobility is presented, proving that noise index measurements can be used as an indicator in thick-film quality and reliability diagnostics. In addition, this analysis can serve as a basis for development of a new diagnostic method for thick resistive films based on noise index measurements.
Keywords :
"Acoustical engineering","Noise reduction","Resistors","Glass","Thickness measurement","Noise measurement","Voltage","Chromium","Electrons","Electrical resistance measurement"
Conference_Titel :
Microelectronics, 2000. Proceedings. 2000 22nd International Conference on
Print_ISBN :
0-7803-5235-1
DOI :
10.1109/ICMEL.2000.838745
