• DocumentCode
    3782805
  • Title

    A relationship between structural characteristics and noise properties of thick resistive films

  • Author

    I. Stanimirovic;M.M. Jevtic;Z. Stanimirovic

  • Author_Institution
    Telecommun. & Electron. Inst., Belgrade, Yugoslavia
  • Volume
    2
  • fYear
    2000
  • Firstpage
    521
  • Abstract
    A relationship between structural characteristics and noise properties of thick resistive films using noise reduced mobility is presented, proving that noise index measurements can be used as an indicator in thick-film quality and reliability diagnostics. In addition, this analysis can serve as a basis for development of a new diagnostic method for thick resistive films based on noise index measurements.
  • Keywords
    "Acoustical engineering","Noise reduction","Resistors","Glass","Thickness measurement","Noise measurement","Voltage","Chromium","Electrons","Electrical resistance measurement"
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2000. Proceedings. 2000 22nd International Conference on
  • Print_ISBN
    0-7803-5235-1
  • Type

    conf

  • DOI
    10.1109/ICMEL.2000.838745
  • Filename
    838745
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3782805