DocumentCode :
3782823
Title :
Cell design for boundary-scan implementation
Author :
V. Panic;S. Jankovic;D. Milovanovic;V. Litovski
Author_Institution :
Fac. of Electron. Eng., Nis Univ., Serbia
Volume :
2
fYear :
2000
Firstpage :
719
Abstract :
This paper gives a new approach in cell design for boundary-scan implementation. After recalling on major problems in PCBs testing, a short overview of boundary-scan standard is given. Furthermore, logic level synthesis of boundary-scan cells are done. Logic level design of these cells are used for layout generation. From generated layout, netlist for each circuit is extracted, and after that simulated by Alecsis2.4. The simulation results are compared with expected values, and are presented in appropriate manner.
Keywords :
"Circuit testing","Logic testing","Circuit simulation","Printed circuits","Nails","Integrated circuit testing","Binary search trees","Clocks","Logic design","Packaging"
Publisher :
ieee
Conference_Titel :
Microelectronics, 2000. Proceedings. 2000 22nd International Conference on
Print_ISBN :
0-7803-5235-1
Type :
conf
DOI :
10.1109/ICMEL.2000.838791
Filename :
838791
Link To Document :
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