Title :
X-ray detection with multi-anode sawtooth silicon drift detectors
Author :
J. Sonsky;J. Huizenga;R.W. Hollander;C.W.E. van Eijk;P.M. Sarro
Author_Institution :
Radiat. Technol. Group, Delft Univ. of Technol., Netherlands
Abstract :
We present results of room temperature and low-temperature X-ray measurements with 500 /spl mu/m anode pitch multi-anode linear and sawtooth silicon drift detectors. An analysis of the influence of split events due to the lateral spread of the drifting electron cloud, electronic noise and the general spectroscopic performance of the detectors is given. An energy resolution of 450 eV FWHM was determined for the 5.89 keV line of /sup 55/Fe at 233 K. Split events are completely eliminated.
Keywords :
"X-ray detection","Silicon","X-ray detectors","Temperature","Anodes","Performance analysis","Electrons","Clouds","Spectroscopy","Event detection"
Conference_Titel :
Nuclear Science Symposium, 1999. Conference Record. 1999 IEEE
Print_ISBN :
0-7803-5696-9
DOI :
10.1109/NSSMIC.1999.842463
