Title :
High-level power estimation with interconnect effects
Author :
K.M. Buyuksahin;F.N. Najm
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Abstract :
We extend earlier work on high-level average power estimation to include the power due to interconnect loading. The resulting technique is a combination of an RTL-level gate count prediction method and average interconnect estimation based on Rent´s rule. The method can be adapted to be used with different place and route engines and standard cell libraries. For a number of benchmark circuits, the method is verified by extracting wire lengths from a layout of each circuit and then comparing the predicted (at RTL) power against that measured using SPICE. An average error of 14.4% is obtained for the average interconnect length, and an average error of 25.8% is obtained for average power estimation including interconnect effects.
Keywords :
"Integrated circuit interconnections","Capacitance","Delay estimation","Logic circuits","Logic gates","Wire","Registers","Power dissipation","Permission","Pins"
Conference_Titel :
Low Power Electronics and Design, 2000. ISLPED ´00. Proceedings of the 2000 International Symposium on
Print_ISBN :
1-58113-190-9
DOI :
10.1109/LPE.2000.155277