Title :
Process variation independent built-in current sensor for analogue built-in self-test
Author :
Y. Kilic;M. Zwolinski
Author_Institution :
Dept. of Electron. & Comput. Sci., Southampton Univ., UK
fDate :
6/23/1905 12:00:00 AM
Abstract :
A new design of built-in current sensor for dynamic supply current testing of analogue integrated circuits is proposed. The sensor has been designed and realized with AMS 0.8 /spl mu/m CYE CMOS technology. The sensor occupies 0.019 mm/sup 2/ silicon area, which is almost as big as a simple two-stage CMOS opamp. Unlike previously published sensors, this new built-in current sensor is process variation independent.
Keywords :
"Automatic testing","Voltage","Circuit testing","Current supplies","Electronic equipment testing","Monitoring","Mirrors","Integrated circuit testing","CMOS technology","Computer science"
Conference_Titel :
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Print_ISBN :
0-7803-6685-9
DOI :
10.1109/ISCAS.2001.922257
