DocumentCode :
3783545
Title :
Load-sensitive flip-flop characterizations
Author :
Seongmoo Heo;K. Asanovic
Author_Institution :
Lab. for Comput. Sci., MIT, Cambridge, MA, USA
fYear :
2001
fDate :
6/23/1905 12:00:00 AM
Firstpage :
87
Lastpage :
92
Abstract :
Different flip-flop designs vary in the number and complexity of logic stages they contain, and hence have different inherent parasitic delays and output drive strengths. We examine the effect of electrical load on flip-flop delay and energy consumption and show that the relative ranking of optimized flip-flop structures varies widely with both electrical effort and absolute load. We also show that some structures benefit substantially from the addition of appropriate output buffering.
Keywords :
"Flip-flops","Tellurium","Clocks","Delay effects","Circuits","Energy measurement","Inverters","Parasitic capacitance","Testing","Optimization methods"
Publisher :
ieee
Conference_Titel :
VLSI, 2001. Proceedings. IEEE Computer Society Workshop on
Print_ISBN :
0-7695-1056-6
Type :
conf
DOI :
10.1109/IWV.2001.923144
Filename :
923144
Link To Document :
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