Title :
Comparative characteristics of thick-film integrated LC filters
Author :
V.D. Desnica;L.D. Zivanov;O.S. Aleksic;M.D. Lukovic;M.D. Nimrihter
Author_Institution :
Fac. of Eng., Novi Sad Univ., Serbia
Abstract :
The paper describes the design, fabrication, and test of integrated LC filters in thick-film technology. The range of filters was electrically characterized using the HP 8566B network analyzer. We present a scalable analytical model for thick-film integrated LC filters that is suitable for design and circuit simulations. We also provide simple expressions for evaluating the optimum conductor thicknesses.
Keywords :
"Filters","Cables","Dielectric substrates","Electromagnetic compatibility","Electromagnetic interference","Capacitance","Fabrication","Analytical models","Circuit simulation","Conductors"
Journal_Title :
IEEE Transactions on Instrumentation and Measurement
DOI :
10.1109/TIM.2002.802238
