• DocumentCode
    3784749
  • Title

    Extending IEEE Std. 1149.4 analog boundary modules to enhance mixed-signal test

  • Author

    U. Kac;F. Novak;F. Azais;P. Nouet;M. Renovell

  • Author_Institution
    Jozef Stefan Inst., Ljubljana, Slovenia
  • Volume
    20
  • Issue
    2
  • fYear
    2003
  • Firstpage
    32
  • Lastpage
    39
  • Abstract
    Will it or won´t it? The 1999 IEEE 1149.4 Standard for a mixed-signal test bus is on the cusp of industrial acceptance, but it´s not clear whether industry will pick it up. This study, by two leading European research institute, delves into the details of hardware implementation and, in so doing, contributes to the growing literature on this topic.
  • Keywords
    "Circuit testing","Logic testing","Libraries","Switches","Registers","Programmable logic devices","Silicon","Voltage control","Hardware","Debugging"
  • Journal_Title
    IEEE Design & Test of Computers
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2003.1188260
  • Filename
    1188260
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3784749