Title :
Extending IEEE Std. 1149.4 analog boundary modules to enhance mixed-signal test
Author :
U. Kac;F. Novak;F. Azais;P. Nouet;M. Renovell
Author_Institution :
Jozef Stefan Inst., Ljubljana, Slovenia
Abstract :
Will it or won´t it? The 1999 IEEE 1149.4 Standard for a mixed-signal test bus is on the cusp of industrial acceptance, but it´s not clear whether industry will pick it up. This study, by two leading European research institute, delves into the details of hardware implementation and, in so doing, contributes to the growing literature on this topic.
Keywords :
"Circuit testing","Logic testing","Libraries","Switches","Registers","Programmable logic devices","Silicon","Voltage control","Hardware","Debugging"
Journal_Title :
IEEE Design & Test of Computers
DOI :
10.1109/MDT.2003.1188260
