• DocumentCode
    3784770
  • Title

    Steganalysis using image quality metrics

  • Author

    I. Avcibas;N. Memon;B. Sankur

  • Author_Institution
    Dept. of Electron. Eng., Uludag Univ., Bursa, Turkey
  • Volume
    12
  • Issue
    2
  • fYear
    2003
  • Firstpage
    221
  • Lastpage
    229
  • Abstract
    We present techniques for steganalysis of images that have been potentially subjected to steganographic algorithms, both within the passive warden and active warden frameworks. Our hypothesis is that steganographic schemes leave statistical evidence that can be exploited for detection with the aid of image quality features and multivariate regression analysis. To this effect image quality metrics have been identified based on the analysis of variance (ANOVA) technique as feature sets to distinguish between cover-images and stego-images. The classifier between cover and stego-images is built using multivariate regression on the selected quality metrics and is trained based on an estimate of the original image. Simulation results with the chosen feature set and well-known watermarking and steganographic techniques indicate that our approach is able with reasonable accuracy to distinguish between cover and stego images.
  • Keywords
    "Image quality","Steganography","Analysis of variance","Multivariate regression","Image analysis","Watermarking","Cryptography","Information science","Context","Rendering (computer graphics)"
  • Journal_Title
    IEEE Transactions on Image Processing
  • Publisher
    ieee
  • ISSN
    1057-7149
  • Type

    jour

  • DOI
    10.1109/TIP.2002.807363
  • Filename
    1192983