DocumentCode :
3785264
Title :
Expanded Papers from the 2003 IEEE International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)
Volume :
51
Issue :
3
fYear :
2004
Firstpage :
518
Lastpage :
519
Journal_Title :
IEEE Transactions on Electron Devices
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2004.824990
Filename :
1268288
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3785264
